Browsing by Author "Parlak, Mehmet"
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Article A new method to determine the continuous refractive index of an absorbing film by Generalized Stockwell Transform(Optics and Laser Technology, 2023-12) Coşkun, Emre; Emir, Cansu; Selamet, Semanur; Parlak, Mehmet; Özder, SerhatGeneralized Stockwell Transform (GST) was adapted to analyze a transmittance signal to continuously determine the refractive index and extinction coefficient. The process is built by analyzing oscillation frequencies of the transmission signal where oscillations exist. The simulation studies clearly show the advantage of the locally referenced phase property of the presented method. The validity of the method was checked for a CdS thin film. The results determined by the GST method are consistent with the results determined by envelope and other signal analyzing methods, and the literature. The noise and relative error analysis of the method was also discussed.Article Nanowire geometry effects on devices and transport mechanisms: SnS2/SiNW heterojunction(Journal of Materials Science, 2023-10-04) Coskun, Emre; Emir, Cansu; Terlemezoğlu, Makbule; Parlak, MehmetThe semiconductor nanowire technology has become essential in developing more complex and efficient devices. In this study, the Si nanowire (SiNW) heterojunction structure with a two-dimensional SnS2 thin film was investigated. The SiNW array was created by the metal-assisted etching method because of length control and production over large areas of nanowires. The created SiNW has more diminishing reflectivity compared with Si planar substrate. The diode characteristics of SnS2/SiNW and SnS2/Si planar heterojunctions were investigated by dark current analysis at room temperature, and the improving diode characteristics by the three-dimensional interface between SiNW and SnS2 thin film were discussed. Transport mechanisms of the SiNW heterojunction were also studied for various methods. Thermionic emission and thermally assisted tunneling models are the dominant mechanisms for low voltages (0.02–0.20 V), and the space charge limiting current mechanism dominates the current for comparingly high voltages (0.20–0.40 V). All the values reveal the significant impact of the SiNW on heterojunctions for improving efficiency.Article Performance Analysis of CuSbSe2Thin-Film Solar Cells with Cd-Free Window Layers(Materials Letters, 2024-05-15) Sürücü, Gökhan; Bal, Ersin; Gencer, Ayşenur; Parlak, Mehmet; Sürücü, ÖzgeThis study investigates novel thin-film solar cells featuring CuSbSe2 (CASe) with ZnSnO and ZnMgO windows in the layer superstrate structure. For glass/ITO/ZnMgO/CASe/Cu + Au, the J-V measurements reveal a shortcircuit current density (Jsc) of 19.4 mA/cm2, an open-circuit voltage (Voc) of 0.28 Volts, a fill factor (FF) of 39.14 %, and a power conversion efficiency (eta) of 2.13 %. Similarly, glass/ITO/ZnSnO/CASe/Cu + Au exhibits Jsc around 19.6 mA/cm2, Voc around 0.31 Volts, FF around 40 %, and eta of 2.43 %. This paper is a pioneering contribution, introducing novel thin-film solar cells with a distinctive superstrate structure utilizing CASe in conjunction with ZnSnO and ZnMgO windows. The comprehensive study presents the first-ever characterization and performance evaluation of these innovative configurations, shedding light on their unique potential in advancing sustainable solar energy technology.Article Physical characterization of thermally evaporated Sn–Sb–Se thin films for solar cell applications(Applied Physics A, 2023-04-26) Bektaş, Tunç; Sürücü, Özge; Terlemezoğlu, Makbule; Parlak, MehmetThe substitution of Sb in binary SnSe structure may lead to tailoring the physical properties of both SnSe and SbSe, promising absorber layers for thin film solar cells. The resulting Sn-Sb-Se structure could be an outstanding material for photovoltaic applications. In this study, Sn-Sb-Se thin films were deposited by thermal evaporation, and the effect of annealing on the films' structural, optical, and electrical properties were reported. XRD measurement shows that annealing at 300 degrees C yields the best crystalline quality, and structural parameters were calculated using XRD data. SEM and AFM measurements indicate deformation in the film surface after annealing at 400 degrees C. UV-Vis spectroscopy measurement provides a high absorption coefficient which indicates a direct band gap. The band gap and activation energies of the as-grown sample were found as 1.59 eV and 106.1 meV, respectively. The results of SEM, AFM, XRD, Raman, UV-Vis spectroscopy and temperature-dependent photoconductivity measurements were discussed throughout the paper.