article.page.titleprefix
Physical characterization of thermally evaporated Sn–Sb–Se thin films for solar cell applications

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dc.contributor.authorBektaş, Tunç
dc.contributor.authorSürücü, Özge
dc.contributor.authorTerlemezoğlu, Makbule
dc.contributor.authorParlak, Mehmet
dc.date.accessioned2023-12-12T08:45:56Z
dc.date.available2023-12-12T08:45:56Z
dc.date.issued2023-04-26
dc.descriptionPublished by Applied Physics A, https://doi.org/10.1007/s00339-023-06656-4, Tunc Bektas & Mehmet Parlak, Department of Physics, Middle East Technical University, 06800, Ankara, Turkey, Tunc Bektas & Ozge Surucu, Department of Electrical and Electronics Engineering, Atilim University, 06836, Ankara, Turkey, Makbule Terlemezoglu, Department of Physics, Gazi University, 06560, Ankara, Turkey, Mehmet Parlak, Center for Solar Energy Research and Applications (GÜNAM), Middle East Technical University, 06800, Ankara, Turkey.
dc.description.abstractThe substitution of Sb in binary SnSe structure may lead to tailoring the physical properties of both SnSe and SbSe, promising absorber layers for thin film solar cells. The resulting Sn-Sb-Se structure could be an outstanding material for photovoltaic applications. In this study, Sn-Sb-Se thin films were deposited by thermal evaporation, and the effect of annealing on the films' structural, optical, and electrical properties were reported. XRD measurement shows that annealing at 300 degrees C yields the best crystalline quality, and structural parameters were calculated using XRD data. SEM and AFM measurements indicate deformation in the film surface after annealing at 400 degrees C. UV-Vis spectroscopy measurement provides a high absorption coefficient which indicates a direct band gap. The band gap and activation energies of the as-grown sample were found as 1.59 eV and 106.1 meV, respectively. The results of SEM, AFM, XRD, Raman, UV-Vis spectroscopy and temperature-dependent photoconductivity measurements were discussed throughout the paper.
dc.description.sponsorshipTurkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK)-120F286
dc.identifier.citationhttp://hdl.handle.net/20.500.14411/1874
dc.identifier.issn0947-8396
dc.identifier.urihttps://doi.org/10.1007/s00339-023-06656-4
dc.language.isoen
dc.publisherApplied Physics A
dc.relation.ispartofseries129; 381
dc.subjectSn–Sb–Se, Thin film, Annealing, Characterization
dc.titlePhysical characterization of thermally evaporated Sn–Sb–Se thin films for solar cell applications
dc.typeArticle
dspace.entity.typeArticle

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